2. Analysis Service
  3. FAQ


Q Can transparent single layer films be measured?

A They can be measured in a three-layer structure with reflective films formed on both sides.

Q Can thin films on silicon substrates be measured?

A They can be measured, but both surfaces of the substrate must be optically polished.

Q What materials are suitable as reflective films?

A Mo, Pt, Al, etc are suitable. *Au, Cu and Ag are not suitable as reflective films.