Instrument
| Model | NanoTR |
|---|---|
| Configuration | Nanosecond thermoreflectance method Rear heating - front detection (RF) Front heating - front detection (FF) |
| Sampling rate | 0.5ns |
| Sample film thickness | RF Configuration Metal : 1um - 20um Ceramic : 300nm - 5um Organic : 30nm - 2um etc. FF Configuration Thicker than 1um |
| Substrate | Transparent / Opaque Size : 10×10mm - 20×20mm Thickness : 1mm max. |
| Measurement items | Thermal diffusivity Thermal effusivity Thermal conductivity Interfacial thermal resistance |
| Measurement time | Less than 60 seconds |
| Option | High temperature measurement : room temperature - 300℃ Distribution measurement |
Installation environment
| Ambient temperature | 15～30℃ |
|---|---|
| Humidity | 45％～70％ |
| Power supply | AC100V（±10％）、50/60Hz、500VA |
| Weight | 40kg |
Instrument
| Model | PicoTR |
|---|---|
| Configuration | Picosecond thermoreflectance method Rear heating - front detection (RF) Front heating - front detection (FF) |
| Sampling rate | 1ps |
| Sample film thickness | RF Configuration Metal : 100nm - 900nm Ceramic : 10nm - 300nm Organic : 10nm - 100nm etc. FF Configuration Thicker than 100nm |
| Substrate | Transparent / Opaque Size : 10×10mm - 20×20mm Thickness : 1mm max. |
| Measurement items | Thermal diffusivity Thermal effusivity Thermal conductivity Interfacial thermal resistance |
| Measurement time | Less than 5 minutes |
| Option | High temperature measurement : room temperature - 500℃ |
Installation environment
| Ambient temperature | 15～30℃ |
|---|---|
| Humidity | 45％～70％ |
| Power supply | AC100V（±10％）、50/60Hz、500VA |
| Weight | Optical unit: 40kg Control unit: 50kg |
※Specifications and design are subject to change for improvement without prior notice.
2-1-6 Sengen, Tsukuba, Ibaraki 305-0047 Japan TEL. +81-29-828-7540 / FAX. +81-29-828-7541
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