1983 | AIST/NMIJ* started research on thermophysical properties measurement by Laser Flash method and establishment of national standard. |
---|---|
1990 | AIST/NMIJ* started research on thermophysical properties measurement for thin films by thermoreflectance methods. |
2006 April | Adopted AIST Innovation Center for Start-ups |
2008 March | Thermal Analysis System - NanoTR completed. |
2008 May | PicoTherm Corporation was established. Received the title of AIST Start-ups |
2008 June | Launched measurement and analysis service for measuring thermophysical properties of thin films |
2010 September | Launched sales of Thermal Analysis System - NanoTR |
2011 July | Sales representation agreement with Quantum Design Japan, Inc. |
2012 December | New product release - Thermal Analysis System - PicoTR |
2013 June | “Joyo Business Award 2013” Excellence (Rose) Award |
“2nd New Business Plan Competition for Women Entrepreneurs” finalist | |
2014 January | Sales representation agreement with NETZSCH JAPAN |
2020 October | PicoTherm Corporation joined the NETZSH Group as a wholly owned subsidiary of NETZSCH Japan, K.K. |
2021 July | PicoTherm Corporation merged with NETZSCH Japan K.K. as NETZSCH Japan’s Tsukuba Office. |
*National Institute of Advanced Industrial Science and Technology/National Metrology Institute of Japan
2-1-6 Sengen, Tsukuba, Ibaraki 305-0047 Japan TEL. +81-29-828-7540 / FAX. +81-29-828-7541
Copyright (C) PicoTherm Corporation All Rights Reserved.