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Specification

NanoTR

Instrument

Model NanoTR
Configuration Nanosecond thermoreflectance method
Rear heating - front detection (RF)
Front heating - front detection (FF)
Sampling rate 0.5ns
Sample film thickness RF Configuration
 Metal : 1um - 20um
 Ceramic : 300nm - 5um
 Organic : 30nm - 2um etc.
FF Configuration
 Thicker than 1um
Substrate Transparent / Opaque
Size : 10×10mm - 20×20mm
Thickness : 1mm max.
Measurement items Thermal diffusivity
Thermal effusivity
Thermal conductivity
Interfacial thermal resistance
Measurement time Less than 60 seconds
Option High temperature measurement :
 room temperature - 300℃
Distribution measurement

Installation environment

Ambient temperature 15~30℃
Humidity 45%~70%
Power supply AC100V(±10%)、50/60Hz、500VA
Weight 40kg
PicoTR

Instrument

Model PicoTR
Configuration Picosecond thermoreflectance method
Rear heating - front detection (RF)
Front heating - front detection (FF)
Sampling rate 1ps
Sample film thickness RF Configuration
 Metal : 100nm - 900nm
 Ceramic : 10nm - 300nm
 Organic : 10nm - 100nm etc.
FF Configuration
 Thicker than 100nm
Substrate Transparent / Opaque
Size : 10×10mm - 20×20mm
Thickness : 1mm max.
Measurement items Thermal diffusivity
Thermal effusivity
Thermal conductivity
Interfacial thermal resistance
Measurement time Less than 5 minutes
Option High temperature measurement :
 room temperature - 500℃
 

Installation environment

Ambient temperature 15~30℃
Humidity 45%~70%
Power supply AC100V(±10%)、50/60Hz、500VA
Weight Optical unit: 40kg
Control unit: 50kg

※Specifications and design are subject to change for improvement without prior notice.